Low-Temperature Thermal Expansion in Chalcopyrite-Type Compound Semiconductors

Solids whose crystal structures are based on tetrahedrally-coordinated ions may show the intriguing property of negative thermal-expansion.

The ternary AIBIIICVI semiconductors (A = Ag, Cu; B = Al, Ga, In; C = S, Se, Te), exhibit such a tetrahedral coordination (see Fig. 5.7). The coordination tetra­hedron around an anion (sulfur or selenium) consists of two monovalent and two trivalent cations. The chemical bonds within such a tetrahedron are of mixed covalent and ionic character, whereby the ionicity of the bonds is different for the AI-CVI and BIII-CVI bonds. These different interactions result in different bond lengths (RAC Ф RBC) as well as bond angles and lead to a displacement of the anions from the ideal tetrahedral site by a quantity u = lx — %l (where x is the anion x coordinate).

The linear thermal-expansion coefficients are closely related to the Gruneisen parameters у of lattice vibrations [25]. The occurrence of a negative thermal — expansion can be understood using the notation of a balance between acoustic shear and compression modes of the observed crystal structure. The Gruneisen parameters of the shear modes show a tendency to negative values, while those of the com­pression modes are positive [25-27]. Hence, the temperature dependence of the thermal expansion is determined by the degree of excitations of the various modes and can change its sign when the relative thermal-population of the modes varies.

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In AIBIIIC2VI chalcopyrite-type semiconductors the thermal-expansion behaviour is described by the independent linear thermal-expansion coefficients aa and ac with

The uniaxial chalcopyrite-type structure comes with two independent Gruneisen parameters ya and yc, which are related to aa and ac according to [28]:

Ca = C [(C11 + C13H + 4^] and Ус = pm [2c13aa + 4,«c] . (5.4)

Cp Cp

Here Vm is the molar volume, Cp the molar specific-heat at constant pressure and cy are the adiabatic elastic-stiffnesses. With increasing ionicity the Gruneisen parameter should become more negative [29]. Thus, the covalent character of the chemical bond is expected to strongly affect the Gruneisen parameter.

The determination of linear thermal-expansion coefficients by dilatometry or X-ray diffraction [30-33] has shown that aa and ac vary independently with tem­perature. This is caused by the axial symmetry of the chalcopyrite-type crystal structure and the difference in strength of the Cu-CVI and BIII-CVI cation-anion bonds.

The investigation of the negative thermal-expansion is conveniently achieved by neutron powder diffraction. One aspect for the use of neutrons is again the high intensity in the diffraction pattern at high Q-values, important for an exact deter­mination of the chalcogen position. It is important to monitor the change of this position at low temperatures to describe the bond stretching during cooling. The negative thermal-expansion has been studied for several chalcopyrite-type com­pounds, whereby the focus now lies on Cu(InxGa1-x)Se2 once with high (x = 0.918) and once with low indium content (x = 0.096), to show the effect of different bond ionicities on the negative thermal-expansion. Neutron powder diffraction patterns were collected for temperatures between 1.5 K > T > 300 K and structures refined by the Rietveld method according to the previously-described sequence. The ion — icity can be calculated following Phillip’s definition [34]:

Подпись:(XA-XB)2

= 1 — e 4

with XA and XB the electronegativity of the elements A and B (XCu = 1.9; XGa = 1.81; XIn = 1.78). According to Phillip’s definition the bond ionicities increase from Cu-Se (fi = 0.1002) to In-Se (fi = 0.115) and Ga-Se (f — = 0.128). Thus the ionicity of the BIII-Se cation-anion bond is increasing with increasing substitution of indium by gallium. From this it follows that with a high amount of gallium the difference in bond ionicity between the Cu-Se and BIII-Se cation-anion bond increases, which lead to an increased anisotropy.

The higher anisotropy affects the change of lattice parameters with decreasing temperature, which is stronger for the gallium-rich Cu(In, Ga)Se2 and pure CuGaSe2 than for indium-rich Cu(In, Ga)Se2 (see Fig. 5.8). Applying a third-order polynomial fit to the lattice parameters the thermal-expansion coefficients aa and ac, can be derived. The temperature at which the linear thermal-expansion becomes negative (T0), is seen to vary with the chemical composition (see Table 5.2).

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Fig. 5.8 Lattice constants a and c as a function of temperature for a the In-rich sample with In/

(In + Ga) = 0.918 b the Ga-rich sample with In/(In + Ga) = 0.096 and c pure CuGaSe2

Table 5.2 Comparison of bond ionicity and the respective critical temperatures of aa and ac as well as of the average thermal-expansion coefficient

Подпись: Fig. 5.9 The tetragonal deformation u as a function of temperature for the indium- rich and gallium-rich Cu (InxGa1-x)Se2 compounds
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The variation of T0 with chemical composition should be discussed in context with the bond ionicity of the BnI-Se bonds, which increase with increasing sub­stitution of indium by gallium. Thus, with increasing gallium content the ionicity increases and the temperature, for which the linear thermal-expansion coefficient changes its sign, increases. This is observed for Cu(InxGa1-x)Se2 with different x-values as summarized in Table 5.2.

The In/(In + Ga) ratio strongly influences the character of the covalent-ionic BIII-Se cation-anion bond, and therefore the behaviour of the linear thermal — expansion coefficients of the two lattice constants aa and ac.

Also, the x-parameter of the selenium anion as a function of temperature is strongly affected by the different bond ionicities. In the Ga-rich sample the tetragonal deformation u = 0.25-x(Se) strongly tends to zero with decreasing temperature, whereas it stays almost constant for the In-rich sample (Fig. 5.9). This effect is explained by the higher bond-ionicity for the Ga-Se bond compared to the In-Se bond.

The change of the tetragonal distortion and the anion position parameter x(Se) is reflected by the change in the average cation-anion bond distances and angles, which change markedly for the Ga-rich sample compared to In-rich sample (see

Fig. 5.10).