Как выбрать гостиницу для кошек
14 декабря, 2021
In TEM, the sample is bombarded by an electron beam. The resolution is determined by the wavelength of the electron and the numerical aperture of the electron optical lens. Similar to the wavelength of neutrons, the wavelength of the electrons is calculated by Eq. (4.93). The energy of the electrons in TEM microscopes is typically 100—300 keV. At 100 keV electron energy, and taking into consideration the mass of the electron, the wavelength of the electron is about 4 X 1012 m. The resolution (d) is quantitatively expressed as follows:
d = _A_
2n sin a 2NA
where A is the wavelength of the electron, n is the refractive index of the medium of the lens, a is the half-angle of the maximum cone of radiation that can enter or exit the lens, and NA is the numerical aperture. This means that theoretically the maximum resolution of the electron microscope is about 2 pm. Practically, the best resolution is in the order of tenths of a nanometer.
Since the electron is a charged particle with a relatively short range, the sample must be thin to transmit the electrons. Therefore, the method requires special preparation of the samples. The thin samples are placed on gold sample holders, as illustrated in Figure 10.21.
Figure 10.21 A gold sample holder for TEM. The diameter is about 3 mm.
The irradiating electrons are scattered on the electrons of the irradiated atoms. Thus, the light elements have a smaller degree of scattering than the heavier ones. For this reason, the compounds consisting of light elements, such as organic substances, are covered by contrast material with a high atomic number (e. g., osmium, lead, gold, silver, etc.). These metals are evaporated or adsorbed onto the surface of the sample.