Process description and experimental setup

In the SDS process (see flow diagram in Fig. 1) a bed of silicon dust, obtained from high purity gaseous feedstock, is prepared, acting both as a cheap substrate and as a “sacrificial detachment layer”. A thick film is then deposited on this bedding layer by fast CVD, at low temperature and atmospheric pressure. Finally, the detached free standing ribbon is recrystallised by a floating molten zone (ZMR — Zone Melting Recrystallization) technique.

The advantages of the SDS process are: (i) no substrate and therefore no associated cost and no contamination; (ii) low energy and thermal budget by use of atmospheric pressures and low temperature CVD; (iii) high quality, free standing, crystalline silicon sheet by float zone crystallisation, with no contact with foreign materials.

The SDS process is well suited for operation in a continuous mode. For example, at a 20 pm/min deposition rate (achievable with silane at ~900°C), 10 minutes are required to achieve a 200 pm thick pre-ribbon. This deposition rate is such that, during the recrystallization step, with a constant advance speed of 10mm/min, only a 100 mm long high temperature (900°C) zone is required.

 

Si powder
layer

 

deposition
by CVD

 

as-grown multicrystalline

nanocrystalline Si ribbon

Si ribbon

 

► ./’va

 

Separation

 

ZMR

 

Fig. 1. SDS process flowchart.